Explain Briefly Bragg’s Law.
[3 marks]Describe different modes of AFM with Diagram.
[4 marks]Write short note on Scanning Electron Microscope SEM. (With Diagram)
[7 marks]Write down Components of AFM.
[3 marks]Write down Advantages and Disadvantages of SEM.
[4 marks]Explain Transmission Electron Microscope TEM. (With Diagram)
[7 marks]Describe Advanced Optical Microscopy AOM.
[7 marks]Define Profilometry briefly.
[3 marks]Describe Two Probe Method For Electrical Measurement.
[4 marks]Explain Working of Scanning Tunneling Microscope STM.
[7 marks]What Happens when a Non-Conducting Sample is placed in the SEM and Which technique is used for the measurement of data?
[3 marks]Derive Bragg’s Law for XRD.
[4 marks]Explain Working and Construction of X-Ray Diffraction XRD with Diagram and how it is used to measure Particle size.
[7 marks]Explain the Concept of Tunneling.
[3 marks]Explain Drawbacks of Two Probe Method over Four Probe Method.
[4 marks]Describe Working and Principle of Atomic Force Microscope AFM.
[7 marks]Which Mode of AFM operation is responsible for destruction of sample?
[3 marks]What is Cantilever? In which Microscopy it is used?
[4 marks]List out Application of SEM and TEM.
[7 marks]List out the components used in Four Probe Method with Diagram.
[3 marks]Define Conductivity, Resistivity, and Ohm’s Law with Units.1
[4 marks]Explain Resistivity Measurement through Four Probe Method with Setup.
[7 marks]Define Elliptical Polarized Light.
[3 marks]Describe Advantages and Disadvantages of TEM.
[4 marks]Write short note on Ellipsometry. (Construction and Working with Diagram)
[7 marks]