Draw flow chart of VLSI development process with mentioning involved testing at each stage.
[3 marks]Define following terms respect to VLSI testing: 1. Yield, 2. Reject rate, 3. Fault coverage and 4. Fault detection efficiency.
[4 marks]Draw two - inputs CMOS NOR gate and write truth table for fault-free circuit and all possible transistor faults. Discuss how to detect all possible transistor faults in this circuit and define and calculate collapse faults.
[7 marks]What is goal of design for testability (DFT) and enlist three basic approaches of DFT.
[3 marks]Define Controllability, observability, testability and testability analysis. Enlist testability analysis techniques.
[4 marks]Write SCOAP combination controllability and observability calculation rules of different logic gates. Find combinational controllability and observability of Half Adder logic circuit at different site using SCOAP analysis techniques.
[7 marks]Derive equation of combinational and sequential controllability and observability of a, b, d, r, CK and q sites for given circuit using SCOAP techniques. rr RReesseett aa dd DD QQ qq bb CCKK
[7 marks]Compare Muxed D, Clocked and LSSD scan cells.
[3 marks]What is scan design rule of derived clock based design and explain it recommended solution with an example.
[4 marks]Enlist three different scan design architecture of DFT. Explain Muxed- Dbased full scan design architecture in detail.1
[7 marks]Draw a flow chart of logic simulation for digital circuit design verification.
[3 marks]Write truth table of four valued logic (0, 1, u, z) 2- inputs AND and OR gates and compare binary logic with four valued logic.
[4 marks]Enlist various algorithms for fault simulation and explain serial fault simulation in detail with algorithm flow chart and example.
[7 marks]Define Transport and Inertial Delay with an example.
[3 marks]Enlist different stages of compile code simulation with its function and draw flow chart of logic levelization.
[4 marks]Define controlling and inversion values of different logic gates (AND, OR, NAND and NOR). Explain input scanning algorithm with flow chart.
[7 marks]What are the advantages of design and verification reuse.
[3 marks]What is test bench? Differentiate: Testing and Verification
[4 marks]What is linting tool? Explain linting verilog source code and limitation of linting tools.
[7 marks]What is assertion? What are the two broad classes of assertion
[3 marks]What are the different approaches of functional verification? Elaborate any one approach.
[4 marks]What is code coverage? And explain it in details. What does 100% code coverage mean?
[7 marks]Enlist purposes of matric as verification tool.
[3 marks]What do you mean by verification intellectual property?
[4 marks]Design 4x1 multiplexer logic design using VHDL/Verilog HDL and write it test bench.
[7 marks]